X-ONE: Complete EDS systems for SEMs
XOne’s analysis functions were carefully researched and engineered to provide accurate, reliable results for even the most difficult specimens.
Our tab user interface guides you quickly and easily through the analysis process. In addition to the acquisition conditions, the tabs provide access to the identification, quantification, advanced fit and spectrum comparison functions. As you proceed with the analysis, you can move back and forth among the tabs to adjust parameters. Naturally, throughout the process, on-line help is just a mouse click away.
Automatic peak identification produces a list of possible elements from which elements are chosen for analysis. KLM markers and the cursor can be used to assist with manual identification. An automatic fit routine makes it easy to see if the element identification is correct.
Samples can be analyzed using the ZAF or φ(ρz) matrix correction routines, by stoichiometry, by fixed concentration and by difference. Analysis can be performed standardless, with stored standards or a mixture of the two. Templates can be saved and executed for repetitive analysis.
3. Advanced fit
The automatic fit function makes easy to expose the presence of hidden peaks. Background regions are first determined automatically and then may be adjusted by the user.
The compare tab is used to compare two spectra with each other in a detailed, channel-by-channel fashion. By subtracting one spectrum from the other, the differences between them are clearly seen.
Quartz Imaging set the standard for digital image acquisition systems for SEMs with our Quartz PCI product. Now we’ve extended this technology to acquire high-resolution, fully live-time corrected X-ray maps at high speed. Combining our imaging technology with our high-performance pulse processor makes it practical to produce maps faster and with higher spatial resolution than most conventional systems.
Rather than acquiring maps in a single pass, XOne builds up the map through multiple passes of the beam. With every pass you can see the maps take shape. When the results are clear, stop the map and move on to the next acquisition.
XOne uses full spectral imaging. This means that all of the X-ray events that occur at each pixel are recorded. Because all of the data is retained, it is possible to select elements for map creation before, during and even after data acquisition is completed. Linescans and fully quantifiable spectra from any region in the map can also be generated during and after acquisition.
For each acquisition, maps for different elements can be displayed at different spatial resolutions. Use a lower spatial resolution for trace elements so that the X-ray events are consolidated into fewer pixels. Where you have a dominant element with many X-ray events, display the map at high-resolution so that small features become apparent.
Of course, because it comes from the PCI people, XOne acquires the SEM image at the same time it is mapping. On most instruments, this SEM image will include the micron marker and other data generated by the microscope.
Linespans can be generated…
…from spectral imaging data.
Any number of maps, as well as the SEM image, may be combined together.
SEM images are acquired simultaneously with map data. For most instruments, the image includes the micron marker information generated by the microscope.
Multiple data items can be combined into a single presentation
1.Elements to be mapped can be selected before, during or after acquisition.
2. Any number of maps, as well as the SEM image, may be combined together.
3. A spectrum can be generated from any region in the map. Analyze this spectrum to get element concentrations that are fully corrected for ZAF matrix effects.
You can pick a region on the SEM image or any combination of maps …
…to generate your spectrum. Analyze this spectrum to get element concentrations that are fully corrected for ZAF matrix effects.
Once you’ve completed your analysis, XOne makes it easy to generate your final report. You can print complete analysis reports from within the XOne software, specifying exactly what items are to be included on the printed page-spectra, analysis results etc.
Alternatively, you can use third-party programs, such as Microsoft® Office, to generate your reports. XOne allows spectra, images, maps, linescans and analysis results to be copied to the clipboard and pasted into other applications. Spectra, images, maps and linescans can also be exported into many popular image formats and then imported into other applications.
XOne can read and write spectra in the industry-standard EMSA file format. This means that XOne’s spectra can be read by software from other vendors and that spectra from other vendors’ equipment can be read and analyzed by XOne. XOne Viewer Software, which will read both EMSA and XOne native files, is available so that you and your clients can view and manipulate X-ray data on office PCs.
Because XOne comes from Quartz Imaging, it is completely compatible with the Quartz PCI system. Options available for PCI include the PCI Intranet Image Server, which permits delivery of XOne results as web pages.
Communicating Your Results
Once you have acquired your data, you want to get it into the hands of your clients and colleagues as quickly and efficiently as possible. XOne’s comprehensive support for networks means that your data can be made available to decision-makers instantly.
Offline viewer software is available which will let users view and analyze data away from the tool, saving instrument time. Because it was designed from the ground up to be a network application, XOne handles issues such as record locking and file sharing transparently and robustly.
XOne’s built-in database support makes it easy to store, search for and retrieve your data. Because XOne is fully compatible with Quartz PCI, X-ray data can be stored in a common database with information from your other laboratory tools. PCI data acquisition solutions are available for most instruments.
Through XOne, you’ll have access to Quartz Imaging’s scalable family of high performance database tools. Data can be accessed through the offline viewer software or, with the PCI Intranet Image Server package, through any web browser. You can create database queries based on database field values and keywords.
XOne Silicon Drift X-Ray Detectors (SDD)
SDD technology manifests itself in three significant advantages to the user:
Silicon Drift Detectors have revolutionized the EDX world, with amazing performance in terms of excellent resolution, low peak shift and high throughput—and they do not require liquid Nitrogen. The XOne system uses PulseTor's MAXIM SDDs, with either 10mm2 or 30mm2 active areas, and use the Moxtek AP3.3 window for superior light element detection. Both standard and premium resolution versions are available.
Click here to learn more about MAXIM
At the heart of the Quartz PCI XOne system is our powerful Torrent digital pulse processor.
One of the dramatic advantages of Silicon Drift Detectors is the high count rates that are achievable. The Torrent digital pulse processor is the industry leader in terms of accurate processing of high rate spectra from SDDs, particularly when low energy peaks are present at high intensities, as is often the case in SEM spectra. The unique Torrent technology has been awarded five patents, most of which involve techniques to improve coincidence detection and accurate measurement of X-ray events very closely spaced in time. This advanced technology leads to better sum peak rejection and more accurate analysis.
ON-X Backscattered Electron Detector
The first and only SDD with integrated BSE detector, providing the same viewing angle for both BSE images and X-ray mapping. Available only with QUARTZ XOne.
- Accurately correlate your X-Ray maps with electron images
- See topographical features and shadowing effects
- See both topography and compositional contrast