ON-X integrates the topographic view of a Low-Angle Backscattered Electron Detector with an X-ray detector
PulseTor’s unique SDD with integrated Take-off Angle Electron Imaging provides the best possible correlation between the electron image and corresponding X-ray maps. For the first time, see what your X-ray detector sees. No longer do you have to explain why features readily visible in your electron image are just dark areas in your X-ray maps, or why they have different shapes and perspectives.
PulseTor employs its new scintillator-on-multiplier (SoM) imaging technology to integrate dual electron sensors with the SDD electron trap assembly:
The result is Take-Off Angle Imaging, providing an electron image having essentially the same line-of-sight as your X-ray maps, showing nearly the same parallax and shadowing effects. When the Take-off Angle image is overlaid with individual or combined corresponding X-ray maps, image features and elemental concentrations are readily revealed with correlation never before possible.
Advantages of ON-X:
- Take-off Angle imaging always provides both atomic number and topographical contrast, adding unique image quality and perspective
- Take-off Angle Imaging provides an electron image having the best possible correlation with your X-ray Maps, including parallax and shadowing effects
- ON-X confirms if dark areas in your X-ray maps are due to topography-induced shadowing